Author/Authors :
Caruso، نويسنده , , T. and Lenardi، نويسنده , , C. and Mazza، نويسنده , , T. and Policicchio، نويسنده , , A. and Bongiorno، نويسنده , , G. and Agostino، نويسنده , , R.G. and Chiarello، نويسنده , , G. and Colavita، نويسنده , , E. and Finetti، نويسنده , , P. and Prince، نويسنده , , K.C. and Ducati، نويسنده , , C. and Piseri، نويسنده , , P. and Milani، نويسنده , , P.، نويسنده ,
Abstract :
Nanostructured titanium dioxide (ns-TiO2) films were grown by supersonic cluster beam deposition method. Transmission electron microscopy demonstrated that films are mainly composed by TiO2 nanocrystals embedded in an amorphous TiO2 phase while their electronic structure was studied by photoemission spectroscopy. The cluster assembled ns-TiO2 films are expected to exhibit several structural and chemical defects owing to the large surface to volume ratio of the deposited clusters. Ultraviolet photoemission spectra (hv = 50 eV) from the valence band unveil the presence of a restrained amount of surface Ti 3d defect states in the band gap, whereas Ti 2p core level X-ray photoelectron (hv = 630 eV) spectra do not manifestly disclose these defects.
Keywords :
Titanium oxide , Photoelectron spectroscopy , Defects , Transmission electron microscopy , Nanostructures
