Title of article
Manganese silicide single crystal and films deposited on Si(1 1 1): A comparative spectroscopic study
Author/Authors
E. and Carleschi، نويسنده , , E. and Magnano، نويسنده , , E. and Zangrando، نويسنده , , M. and Bondino، نويسنده , , F. and Nicolaou، نويسنده , , A. and Carbone، نويسنده , , F. and Van der Marel، نويسنده , , D. and Parmigiani، نويسنده , , F.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2007
Pages
8
From page
4066
To page
4073
Abstract
A comparative experimental study is presented of the electronic properties of MnSi films grown on Si(1 1 1) and of MnSi single crystals, using X-ray absorption spectroscopy (XAS), and core level and valence band photoemission spectroscopy (PES). No significant differences in the electronic structure of the two systems can be found.
tion measurements on the Mn 2p threshold show a mixed valence ground state, where the multiplet structure is washed out by the hybridisation of the Mn 3d states with the Si sp states. These results are also confirmed by photoemission (PE) spectra from the valence band and the Mn 3s, 3p and 2p core levels.
attention has been paid to the effect of contamination. The occurrence of multiplet effects in the absorption spectra indicates unambiguously the localisation of the Mn 3d electrons in Mn–O bonds, which strongly influences the electronic properties of these systems.
Keywords
MNSI , Thin films , Photoemission , growth , X-ray Absorption , electron delocalisation , Contamination effects , Hybridisation
Journal title
Surface Science
Serial Year
2007
Journal title
Surface Science
Record number
1701556
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