Author/Authors :
Bussetti، نويسنده , , G. and Goletti، نويسنده , , C. and Chiaradia، نويسنده , , P. and Sassella، نويسنده , , A. and Campione، نويسنده , , M. and Tavazzi، نويسنده , , S. and Borghesi، نويسنده , , A.، نويسنده ,
Abstract :
The growth process of thin films and multilayers of quaterthiophene and sexithiophene onto molecular single crystals has been monitored in situ and in real time during deposition by organic molecular beam epitaxy, measuring the anisotropy of the optical reflectivity. The evolution of the spectra with thickness provides the signature of an epitaxial growth of the films.
Keywords :
Organic heterojunction , In situ characterization , Thin film structure , Reflectance anisotropy spectroscopy , organic thin films , Molecular Beam Epitaxy
