Title of article
Thickness dependence of magnetic domain formation in La0.6Sr0.4MnO3 epitaxial thin films studied by XMCD–PEEM
Author/Authors
Taniuchi، نويسنده , , Toshiyuki and Yasuhara، نويسنده , , Ryutaro and Kumigashira، نويسنده , , Hiroshi and Kubota، نويسنده , , Masato and Okazaki، نويسنده , , Hiroyuki and Wakita، نويسنده , , Takanori and Yokoya، نويسنده , , Takanori and Ono، نويسنده , , Kanta and Oshima، نويسنده , , Masaharu and Lippmaa، نويسنده , , Mikk and Kawasaki، نويسنده , , Masashi and Koinuma، نويسنده , , Hideomi، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2007
Pages
4
From page
4690
To page
4693
Abstract
We have used photoelectron emission microscopy (PEEM) and X-ray magnetic circular dichroism (XMCD) to study the effect of thin film thickness on the magnetic domain formation in La0.6Sr0.4MnO3 samples that were epitaxially grown on stepped SrTiO3 (0 0 1) substrates. The magnetic image exhibited a stripe structure elongated along the step direction, irrespective of film thickness, suggesting that uniaxial magnetic anisotropy induced by step-and-terrace structures plays an important role in the magnetic domain formation. Additional domains evolved gradually with increasing film thickness. In these domains, the direction of magnetization differed from the step direction due to biaxial magneto-crystalline anisotropy. The evolution of additional magnetic domains with increasing film thickness implies that a competition exists between the two anisotropies in LSMO films.
Keywords
Manganite , Thin film , PEEM , xmcd , spintronics , magnetic domain
Journal title
Surface Science
Serial Year
2007
Journal title
Surface Science
Record number
1702047
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