Title of article :
Adsorption geometry of furan on Si(1 0 0)-2 × 1
Author/Authors :
Lee، نويسنده , , Han-Koo and Kim، نويسنده , , Ki-jeong and Kang، نويسنده , , Tai-Hee and Chung، نويسنده , , J.W. and Kim، نويسنده , , Bongsoo، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2008
Pages :
5
From page :
914
To page :
918
Abstract :
We have investigated adsorption of furan on Si(1 0 0) at room temperature using high resolution photoemission spectroscopy (PES) and near edge X-ray absorption fine structure (NEXAFS) in the partial electron yield (PEY) mode. The Si 2p, C 1s, O 1s spectra of furan on Si(1 0 0) show that furan is chemisorbed on Si(1 0 0)-2 × 1 through [4 + 2] cycloaddition. NEXAFS has been conducted to characterize the adsorption geometry of furan on Si(1 0 0). Since the π∗ orbital of CC bond showed a good angle dependence in carbon K-edge NEXAFS spectra, the angle 28 ± 2° determined from NEXAFS spectra appears to deviate from a theoretical value of 19° for the [4 + 2] cycloaddition by 9°, mostly due to the intrinsic defects on the Si(1 0 0)-2 × 1 substrate surface.
Keywords :
furan , 0  , 0) , Adsorption , PES , NEXAFS , Molecular orientation , Organic-semiconductor interface , Si(1 
Journal title :
Surface Science
Serial Year :
2008
Journal title :
Surface Science
Record number :
1702900
Link To Document :
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