Epitaxial growth of hexadecafluorozincphthalocyanine (F16ZnPc) film deposited on GeS(0 0 1)

The molecular arrangement in the monomolecular layer (1 ML) film of hexadecafluorozincphthalocyanine (F16ZnPc) vacuum-deposited on GeS(0 0 1) in ultrahigh vacuum were studied by low energy electron diffraction (LEED), near edge X-ray absorption fine structure (NEXAFS) spectroscopy, and angle-resolved ultraviolet photoelectron spectroscopy (ARUPS). From the LEED analysis, we found that the F16ZnPc film grows epitaxially on the substrate surface and that the lattice structure in the 1 ML region is commensurate with the lattice of the surface. The tilt angle between the molecular plane and the substrate surface is 12.5° ± 2.5° deduced from the NEXAFS and ARUPS results. We also determined the azimuthal angle of the adsorbed F16ZnPc molecule with respect to the surface orientation of GeS(0 0 1) by comparing the ARUPS spectra with the theoretical simulation. Finally, we suggested a possible full film structure.