Title of article
CAICISS and STM study of and tin phases on Si(1 0 0)
Author/Authors
Visikovskiy، نويسنده , , Anton and Shibata، نويسنده , , Hideyuki and Yoshimura، نويسنده , , Masamichi and Ueda، نويسنده , , Kazuyuki، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2008
Pages
5
From page
1770
To page
1774
Abstract
Tin (Sn) adsorption on Si(1 0 0) surface has been studied by scanning tunneling microscopy (STM) and co-axial impact collision ion scattering spectroscopy (CAICISS). The c ( 8 × 4 ) and ( 5 × 1 ) phases were analyzed to reveal their atomic structure. It has been confirmed that the c ( 8 × 4 ) structure consists of buckled Sn dimers. The ( 5 × 1 ) structure has been found to be partially irregular along ( 5 × 1 ) rows and to consist of double Sn layer. The Sn atoms in the first layer are undimerised while those in second layer form asymmetric dimers.
Keywords
STM , TIN , Silicon , CAICISS
Journal title
Surface Science
Serial Year
2008
Journal title
Surface Science
Record number
1703219
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