Title of article :
Imaging of electronic structure of lead phthalocyanine films studied by combined use of PEEM and Micro-UPS
Author/Authors :
Yamamoto، نويسنده , , I. and Matsuura، نويسنده , , N. and Mikamori، نويسنده , , M. and Yamamoto، نويسنده , , Cesar R. and Yamada، نويسنده , , T. and Miyakubo، نويسنده , , K. and Ueno، نويسنده , , N. and Munakata، نويسنده , , T.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2008
Abstract :
The thin film growth of lead phthalocyanine (PbPc) on graphite substrate has been studied by photoemission electron microscopy (PEEM) operated with tunable UV laser radiation. Origin of the contrast of PEEM images was elucidated by comparison with microspot ultraviolet photoemission spectroscopy (Micro-UPS). The photoelectron yield curves measured with PEEM for annealed films of different coverages were in agreement with the shifts of the vacuum levels determined by Micro-UPS. Below 1 monolayer (ML) coverage, PbPc molecules did not form islands/domains but were sparsely distributed and formed uniform films. Above 1 ML, PbPc molecules formed stable islands of bilayer in a well-ordered 1 ML film. On the other hand, for as-deposited films with thickness equivalent to annealed 0.3 ML coverage, PbPc molecules formed metastable bilayer islands of a few μm-size in the sparsely packed uniform film. These results demonstrate the capability of combined use of the complementary methods PEEM and Micro-UPS to resolve inhomogeneity of electronic structure.
Keywords :
Photoemission electron microscopy (PEEM) , Thin Film Growth , Work function , Electronic structure , Ultraviolet photoelectron spectroscopy (UPS) , organic semiconductor , Phthalocyanine , Photoelectron yield curve
Journal title :
Surface Science
Journal title :
Surface Science