Title of article :
Spectral characterization of thin films of vanadyl hexadecafluorophthalocyanine VOPcF16
Author/Authors :
Basova، نويسنده , , Tamara and Plyashkevich، نويسنده , , Vladimir and Hassan، نويسنده , , Aseel، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2008
Abstract :
In this work, structural features and optical properties of hexadecafluorosubstituted vanadyl phthalocyanine (VOPcF16) films deposited by Organic Molecular Beam Deposition (OMBD) technique have been investigated. Thin films of VOPcF16 were characterised by ellipsometry, optical absorption and vibrational (IR and Raman) spectroscopy. VOPcF16 films deposited onto silicon and quartz substrates held at room temperature are well organized and characterised by a predominantly co-facial parallel arrangement of molecules vertical to the surface. Thermal treatment of these films at 220 °C leads to the transition from one phase to another and formation of the polycrystalline VOPcF16 films with randomly distributed crystallites on the substrate surface.
Keywords :
Phthalocyanines , ellipsometry , Thin films , Raman scattering spectroscopy , IR spectroscopy
Journal title :
Surface Science
Journal title :
Surface Science