• Title of article

    Surface structure of Si(1 1 1)-(8 × 2)–In determined by reflection high-energy positron diffraction

  • Author/Authors

    Fukaya، نويسنده , , Y. and Hashimoto، نويسنده , , M. and Kawasuso، نويسنده , , A. and Ichimiya، نويسنده , , A.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2008
  • Pages
    5
  • From page
    2448
  • To page
    2452
  • Abstract
    By using reflection high-energy positron diffraction (RHEPD) and first-principles calculations, we investigated an In/Si(1 1 1) surface on which the quasi-one-dimensional In atomic chains that exhibit the metal–insulator transition were formed. From the analyses of rocking curves, we found the transformation of the zigzag chain structure of In atomic chains to hexagon structures below 130 K along with the phase transition from the 4 × 1 to the 8 × 2 periodicities. The band structure calculated with the optimum hexagon structure displays the gap opening of 60 meV, which indicates the semiconducting character. This confirms the recent theoretical prediction that the hexagon structure is energetically favored at low temperatures [C. González, F. Flores, J. Ortega, Phys. Rev. Lett. 96 (2006) 136101].
  • Keywords
    Indium , surface structure , Silicon , Reflection high-energy positron diffraction , Total reflection , phase transition
  • Journal title
    Surface Science
  • Serial Year
    2008
  • Journal title
    Surface Science
  • Record number

    1703505