Title of article
Excitation-induced atomic desorption and structural instability of III–V compound semiconductor surfaces
Author/Authors
Tanimura، نويسنده , , Katsumi and Kanasaki، نويسنده , , Jun’ichi، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2008
Pages
10
From page
3162
To page
3171
Abstract
We discuss the laser-induced structural instability of III–V compound semiconductor surfaces. The electronic instability is characterized by local bond rupture of both metallic and nonmetallic atoms at intrinsic surface sites, with the bond-rupture rate super linearly dependent on the excitation density. Spectroscopic studies show that bulk-valence excitation triggers surface bond rupture, and that valence holes are the responsible species. From our results, we propose a mechanistic model based on the two-hole localization induced by a high density of non-equilibrated valence holes, and demonstrate that the model describes all the important features quantitatively and consistently. Additional evidence that further supports the validity of the two-hole mechanism is presented.
Keywords
Desorption induced by electronic transitions (DIET) , Scanning tunneling microscopy , photochemistry , Indium phosphide , Single crystal surfaces
Journal title
Surface Science
Serial Year
2008
Journal title
Surface Science
Record number
1703827
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