Title of article
Investigations of the effect of curing conditions on the structure and stability of amino-functionalized organic films on silicon substrates by Fourier transform infrared spectroscopy, ellipsometry, and fluorescence microscopy
Author/Authors
Kim، نويسنده , , Joonyeong and Seidler، نويسنده , , Paul and Fill، نويسنده , , Catherine and Wan، نويسنده , , Lai Sze، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2008
Pages
8
From page
3323
To page
3330
Abstract
The effect of curing on the structure and stability of amino-functionalized organic films on silicon substrates was investigated using Fourier transform infrared spectroscopy (FTIR), ellipsometry, and fluorescence microscopy. Amino-terminated organic films were prepared on silicon wafers by self-assembling 3-aminopropyltriethoxysilane (APTES) in toluene, cured at different conditions, and washed by sonication in water. For APTES films without curing/or cured at 25 °C, the thickness of APTES films decreased by as much as 65% after sonication in water. FTIR spectra indicate that a substantial amount of physisorbed and/or partially condensed APTES was removed and surface amino groups were oxidized to imines. For APTES films cured at 100 °C, ellipsometric measurements and FTIR spectra showed that the thickness was decreased by ∼10% and that remaining loosely bound APTES had become condensed after curing. Further sonication in water caused no significant changes in the thickness and structure. Independent fluorescence measurements support ellipsometric results and FTIR studies. Our investigations suggest that freshly prepared APTES films are mechanically unstable in aqueous solutions and that proper curing process is required to form physically stable APTES films.
Keywords
SAMs , Grazing-angle attenuated total reflection , ellipsometry , fluorescence microscopy , silanization , APTES , Self-assembled monolayers , 3-Aminopropyltriethoxysilane
Journal title
Surface Science
Serial Year
2008
Journal title
Surface Science
Record number
1703899
Link To Document