Author/Authors :
Tereshchenko، نويسنده , , O.E. and Paget، نويسنده , , D. and Rowe، نويسنده , , A.C.H. and Berkovits، نويسنده , , V.L. and Chiaradia، نويسنده , , P. and Doyle، نويسنده , , B.P. and Nannarone، نويسنده , , S.، نويسنده ,
Abstract :
Well-ordered clean InAs(1 1 1) A and B surfaces have been prepared using HCl–isopropanol solutions and characterized using low-energy electron diffraction and photoemission spectroscopy. The as-treated surfaces are covered by a layer containing arsenic and small amounts of InClx. Annealing induces desorption of the overlayer and reveals (2 × 2) and (1 × 1) structures on the A and B surfaces, respectively. For both surfaces, the surface components of the In 4d and As 3d reveal a charge transfer from the electropositive surface indium to the electronegative surface arsenic. The major advantage of this preparation method over conventional thermal cleaning is a significant reduction in the annealing temperature (≈250 °C) thereby avoiding anion evaporation.
Keywords :
HCl–isopropanol treatment , passivation , Soft X-ray photoemission , InAs , Low energy electron diffraction