• Title of article

    Evidence for H2 at high pressure in the silicon nanocavities after dipping in HF solution

  • Author/Authors

    Romano، نويسنده , , E. and Cerofolini، نويسنده , , G.F. and Narducci، نويسنده , , D. and Corni، نويسنده , , F. and Frabboni، نويسنده , , S. and Ottaviani، نويسنده , , G. and Tonini، نويسنده , , R.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2009
  • Pages
    5
  • From page
    2188
  • To page
    2192
  • Abstract
    The immersion in HF solutions of silicon containing nanocavities (produced by the annealing at high temperature, 950 °C, of silicon implanted with helium at high fluence, 2 × 1016 cm−2) results in the injection of hydrogen in an infrared-mute state (most likely H2) into the nanocavities. The pressure achieved in the cavities is sufficiently high to stabilize the hydrogen coverage of the inner surfaces at temperatures exceeding by 200 °C the one of complete desorption from the outer surface.
  • Keywords
    Hydrogen injection via wet chemistry , Adsorption and desorption at high H2 pressure , MIR infrared spectroscopy , Nanocavities in silicon
  • Journal title
    Surface Science
  • Serial Year
    2009
  • Journal title
    Surface Science
  • Record number

    1704716