Title of article
Evidence for H2 at high pressure in the silicon nanocavities after dipping in HF solution
Author/Authors
Romano، نويسنده , , E. and Cerofolini، نويسنده , , G.F. and Narducci، نويسنده , , D. and Corni، نويسنده , , F. and Frabboni، نويسنده , , S. and Ottaviani، نويسنده , , G. and Tonini، نويسنده , , R.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2009
Pages
5
From page
2188
To page
2192
Abstract
The immersion in HF solutions of silicon containing nanocavities (produced by the annealing at high temperature, 950 °C, of silicon implanted with helium at high fluence, 2 × 1016 cm−2) results in the injection of hydrogen in an infrared-mute state (most likely H2) into the nanocavities. The pressure achieved in the cavities is sufficiently high to stabilize the hydrogen coverage of the inner surfaces at temperatures exceeding by 200 °C the one of complete desorption from the outer surface.
Keywords
Hydrogen injection via wet chemistry , Adsorption and desorption at high H2 pressure , MIR infrared spectroscopy , Nanocavities in silicon
Journal title
Surface Science
Serial Year
2009
Journal title
Surface Science
Record number
1704716
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