Title of article
Reconstructions 3 × 3 and √3 × √3 on SiC(0 0 0 1) studied using RHEED
Author/Authors
Yakovlev، نويسنده , , Nikolai and Xianning، نويسنده , , Xie and Ping، نويسنده , , Loh Kian and Hai، نويسنده , , Xu، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2009
Pages
8
From page
2263
To page
2270
Abstract
The 3 × 3 and √3 × √3 reconstructions on 6H-SiC(0 0 0 1) surface were obtained via depositing thin silicon layer and annealing it in ultrahigh vacuum (without Si flux). Rocking curves of reflection high energy electron diffraction (RHEED) were measured for integer and fractional order beams. They were fitted with results of many-beam calculation on the basis of dynamical theory of RHEED to determine structural parameters. For √3 × √3 superstructure, it was found that the occupancy of adatom states is 0.45 (incomplete coverage). In the sequence of Si–C double layers ABCACB, the lattice is terminated with the layer A. For 3 × 3 superstructure, the rocking curves support the model with twisted tetra-cluster. The best-fit twist is as half of that predicted in ab initio calculations; it is due to limited source of Si atoms to build up the superstructure. Larger twist correlates with higher occupancy of corner sites and with slower cooling rate of the sample after annealing.
Keywords
Electron diffraction , SiC , surface reconstruction
Journal title
Surface Science
Serial Year
2009
Journal title
Surface Science
Record number
1704745
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