Title of article
Determination of atomic positions in silicene on Ag(111) by low-energy electron diffraction
Author/Authors
Kawahara، نويسنده , , K. and Shirasawa، نويسنده , , T. and Arafune، نويسنده , , R. and Lin، نويسنده , , C.-L. and Takahashi، نويسنده , , T. and Kawai، نويسنده , , M. and Takagi، نويسنده , , N.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2014
Pages
4
From page
25
To page
28
Abstract
We have investigated the structure of silicene forming into the (4 × 4) superstructure on Ag(111) by using the low-energy electron diffraction. We found that Si atoms form a buckled honeycomb structure on Ag(111), which fully matches with the structure optimized with the density functional theory calculations. The SiSi bond lengths range from 2.29 to 2.31 إ, which are close to the upper limit of SiSi double bond and shorter than the bond length in the bulk diamond structure. The buckling in the silicene layer causes the displacement of Ag atoms in the first substrate layer with 0.3 إ perpendicular to the surface, which is a compelling evidence of the strong couplings at the interface between the silicene and the substrate.
Keywords
Surface thin layer , Low energy electron diffraction , Silicene
Journal title
Surface Science
Serial Year
2014
Journal title
Surface Science
Record number
1706348
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