• Title of article

    Mass transport in La2Ni1−xCoxO4+δ oxides with the K2NiF4 structure

  • Author/Authors

    Kilner، نويسنده , , J.A and Shaw، نويسنده , , C.K.M، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2002
  • Pages
    5
  • From page
    523
  • To page
    527
  • Abstract
    Oxygen diffusion and surface exchange coefficients have been determined for the materials La2Ni1−xCoxO4+δ by the Isotope Exchange Depth Profile Secondary Ion Mass Spectrometry (IEDP SIMS) method. It is shown that the addition of cobalt (0<x<0.5) leads to the formation of single-phase materials and that the oxygen diffusion coefficient varies only slightly with x. In contrast, the surface exchange coefficient was found to be strongly dependent upon the value of x, with the activation enthalpy for this process dropping to values as low as ∼20 kJ mol−1 for the high cobalt content material.
  • Keywords
    SIMS , Surface exchange , oxygen diffusion , Mixed conductors
  • Journal title
    Solid State Ionics
  • Serial Year
    2002
  • Journal title
    Solid State Ionics
  • Record number

    1709272