Title of article :
Conductive AFM and chemical analysis of highly conductive paths in DC degraded PZT with Ag/Pd electrodes
Author/Authors :
Andrejs، نويسنده , , L. and Oكmer، نويسنده , , H. and Friedbacher، نويسنده , , G. and Bernardi، نويسنده , , J. and Limbeck، نويسنده , , A. and Fleig، نويسنده , , J.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2013
Pages :
12
From page :
5
To page :
16
Abstract :
DC degraded PZT layers were studied by means of energy dispersive X-ray spectroscopy (EDX), laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS), transmission electron microscopy (TEM), scanning electron microscopy (SEM) and conductive atomic force microscopy (C-AFM). It is shown that mainly silver originating from the anode is massively redistributed on/in the PZT during voltage load. Highly conductive silver paths/filaments are strongly localized to grain boundaries in the bulk of the PZT layers and unambiguously identified as responsible for metal-like connection between anode and cathode. Formation of these paths starts close to the anode. This indicates the existence of a novel mode of resistance degradation without impact of humidity. A corresponding mechanism based on voltage induced oversaturation of PZT grains with silver and non-conventional electrochemical formation of anodic silver filaments is suggested.
Keywords :
C-AFM , Grain boundaries , PZT , Silver filaments , Degradation
Journal title :
Solid State Ionics
Serial Year :
2013
Journal title :
Solid State Ionics
Record number :
1712365
Link To Document :
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