• Title of article

    Conductive AFM and chemical analysis of highly conductive paths in DC degraded PZT with Ag/Pd electrodes

  • Author/Authors

    Andrejs، نويسنده , , L. and Oكmer، نويسنده , , H. and Friedbacher، نويسنده , , G. and Bernardi، نويسنده , , J. and Limbeck، نويسنده , , A. and Fleig، نويسنده , , J.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2013
  • Pages
    12
  • From page
    5
  • To page
    16
  • Abstract
    DC degraded PZT layers were studied by means of energy dispersive X-ray spectroscopy (EDX), laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS), transmission electron microscopy (TEM), scanning electron microscopy (SEM) and conductive atomic force microscopy (C-AFM). It is shown that mainly silver originating from the anode is massively redistributed on/in the PZT during voltage load. Highly conductive silver paths/filaments are strongly localized to grain boundaries in the bulk of the PZT layers and unambiguously identified as responsible for metal-like connection between anode and cathode. Formation of these paths starts close to the anode. This indicates the existence of a novel mode of resistance degradation without impact of humidity. A corresponding mechanism based on voltage induced oversaturation of PZT grains with silver and non-conventional electrochemical formation of anodic silver filaments is suggested.
  • Keywords
    C-AFM , Grain boundaries , PZT , Silver filaments , Degradation
  • Journal title
    Solid State Ionics
  • Serial Year
    2013
  • Journal title
    Solid State Ionics
  • Record number

    1712365