Author/Authors :
Horita، نويسنده , , Teruhisa and Nishi، نويسنده , , Mina and Shimonosono، نويسنده , , Taro and Kishimoto، نويسنده , , Haruo and Yamaji، نويسنده , , Katsuhiko and Brito، نويسنده , , Manuel E. and Yokokawa، نويسنده , , Harumi، نويسنده ,
Abstract :
The depth profiles of secondary ion mass spectrometry (SIMS) have been applied to analyze the distribution of 18O and metal oxide ions precisely at La0.6Sr0.4Co0.2Fe0.8O3 − d/Gd0.1Ce0.9O2 − x (GDC)/Y0.15Zr0.85O2 − y (YSZ) interfaces. 18O concentration peak was identified only under cathodic polarization with a constant current density of 0.071 A cm− 2 at 973 K under 18O2 atmosphere. The 18O peak position was corresponded to the Sr condensed zone where SrZrO3 was formed at the GDC/YSZ interfaces. The SrZrO3 formation and the 18O concentration profile pile-up are correlated to each other.
Keywords :
SOFC , isotope labeling , cathode , Depth profiles , SIMS
