Title of article
Development of in situ soft X-ray absorption spectroscopic technique under high temperature and controlled atmosphere
Author/Authors
Oike، نويسنده , , Ryo and Amezawa، نويسنده , , Koji and Nakamura، نويسنده , , Takashi and Tamenori، نويسنده , , Yusuke and Yashiro، نويسنده , , Keiji and Kawada، نويسنده , , Tatsuya، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2014
Pages
3
From page
911
To page
913
Abstract
In this study, in situ soft X-ray absorption spectroscopy (soft XAS) technique, which enables us to analyze electronic structures of oxides at elevated temperatures while controlling atmospheric conditions, was developed. The technique was applied to investigate the electronic structures of La0.6Sr0.4CoO3 − δ. X-ray absorption spectra at the Co L-edges and the O K-edge were measured in the temperature range from room temperature to 873 K and the p(O2) range from 10− 4 to 10− 2 bar. The developed in situ soft XAS technique is found to be effective for evaluating electronic structures of oxides under controlled temperature and p(O2).
Keywords
high temperature , Soft X-ray , in situ , X-ray absorption spectroscopy
Journal title
Solid State Ionics
Serial Year
2014
Journal title
Solid State Ionics
Record number
1712920
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