Title of article :
Raman spectroscopic studies of amorphous vanadium oxide thin films
Author/Authors :
Lee، نويسنده , , Se-Hee and Cheong، نويسنده , , Hyeonsik M. and Seong، نويسنده , , Maeng Je and Liu، نويسنده , , Ping and Tracy، نويسنده , , C.Edwin and Mascarenhas، نويسنده , , Angelo and Pitts، نويسنده , , J.Roland and Deb، نويسنده , , Satyen K. Deb، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2003
Pages :
6
From page :
111
To page :
116
Abstract :
We report on the microstructural changes of amorphous V2O5 films with lithium intercalation. The Raman spectra of as-deposited films show two broad peaks around at 520 and 650 cm−1, due to the stretching modes of the V3–O and V2–O bonds, respectively, and a relatively sharp peak at 1027 cm−1 due to the V5+O stretching mode of terminal oxygen atoms. In addition, there is a peak at 932 cm−1 that we attribute to the V4+O bonds. Comparison of the Raman spectra of V2O5 films with different oxygen deficiencies confirms this assignment. This Raman peak due to the stretching mode of the V4+O bonds develops and shifts toward lower frequencies with increasing lithium concentration. Comparison to results from gasochromic hydrogen insertion indicates that the 932 cm−1 Raman peak is not a result of vibrations which involve Li or H atoms. We propose that the V4+O bonds are created by two different mechanisms: a direct conversion from V5+O bonds and the breaking of the single oxygen bonds involving V4+ ions.
Keywords :
Raman spectroscopy , Amorphous vanadium oxide , oxygen deficiency , Gasochromic , Hydrogen insertion
Journal title :
Solid State Ionics
Serial Year :
2003
Journal title :
Solid State Ionics
Record number :
1715607
Link To Document :
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