Title of article :
Imaging of labeled gas movements at the SOFC electrode/electrolyte interfaces
Author/Authors :
Horita، نويسنده , , Teruhisa and Yamaji، نويسنده , , Katsuhiko and Kato، نويسنده , , Tohru and Sakai، نويسنده , , Natsuko and Yokokawa، نويسنده , , Harumi، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2004
Abstract :
The catalytic activity of metals (Ni and Cu) for CH4 decomposition was compared in the mixture of CH4, D2O (heavy water), and 18O2 (stable isotope of oxygen) by image analysis of secondary ion mass spectrometry (SIMS). Annealing of samples was conducted in the stable isotopes of 18O2 and D2O to label the movements of oxygen and hydrogen at high temperature (1073 K). Mesh-shaped electrode/Y2O3-stabilized ZrO2 samples were adopted to determine the gas/electrode/electrolyte interfaces in a submicrometer level. On the mesh electrode surfaces (Ni and Cu), thin oxide layers were formed, and the oxide layers were active for isotope oxygen exchange. On the Ni surface, diffusion of D and/or exchange of H/D occurred within 20 nm in depth. Carbon deposition occurred on the Ni surface, whereas no carbon deposition was observed on the Cu surface.
Keywords :
Carbon deposition , Isotope exchange , Mesh electrode , Solid oxide fuel cells (SOFCs) , Secondary ion mass spectrometry (SIMS)
Journal title :
Solid State Ionics
Journal title :
Solid State Ionics