Author/Authors :
Lisboa-Filho، نويسنده , , P.N. and Mastelaro، نويسنده , , V.R. and Schreiner، نويسنده , , W.H. and Messaddeq، نويسنده , , S.H and Siu Li، نويسنده , , M. and Messaddeq، نويسنده , , Y. and Hammer، نويسنده , , Sَnia P. and Ribeiro، نويسنده , , S.J.L. and Parent، نويسنده , , P. and Laffon، نويسنده , , C.، نويسنده ,
Abstract :
The present paper focuses on the structural, electronic, and compositional properties of Ge25Ga10S65 glasses before and after UV illumination in air using X-ray photoelectron spectroscopy (XPS) and X-ray absorption spectroscopy (XAS) techniques. The XPS Ge 3d spectra reveal the existence of GeO bonds in the surface region of illuminated glass. In the case of this sample, XAS O K-edge spectra showed the formation of an enriched region of oxygen atoms in the glass bulk, indicating a different bonding structure of oxygen at the surface and in the bulk of the glass. Moreover, the structural changes that occur after UV illumination in the glass sample are identified as the formation of a homogeneous germanium oxide surface layer followed by an intermediary Ge25Ga10S65− yOz subsurface region.
Keywords :
XPS , Oxygen , XAS , Chalcogenide glasses , Photo-induced effects
