• Title of article

    Measurement of oxygen transport kinetics in epitaxial La2NiO4+δ thin films by electrical conductivity relaxation

  • Author/Authors

    Kim، نويسنده , , G. and Wang، نويسنده , , S. and Jacobson، نويسنده , , Robin A.J. and Chen، نويسنده , , C.L.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2006
  • Pages
    7
  • From page
    1461
  • To page
    1467
  • Abstract
    The oxygen transport kinetics of mixed ionic and electronic conducting La2NiO4 thin films made by pulsed laser deposition (PLD) were measured using the electrical conductivity relaxation (ECR) technique. Since the film thickness is ∼ 3000 Å, the oxygen transport kinetics are controlled by the surface exchange rate. The experimental data are not well described by the usual single time constant model for oxygen surface exchange, but a good fit is obtained using two independent time constants. This model implies that the La2NiO4 film consists of two independent regions with different exchange rates that correspond to two different film microstructures.
  • Keywords
    Electrical conductivity relaxation , La2NiO4+? , Oxygen exchange kinetics , Thin film , lanthanum nickel oxide
  • Journal title
    Solid State Ionics
  • Serial Year
    2006
  • Journal title
    Solid State Ionics
  • Record number

    1719050