• Title of article

    Dielectric relaxations in the Ce1−xNdxO2−δ system

  • Author/Authors

    Yamamura، نويسنده , , Hiroshi and Takeda، نويسنده , , Saori and Kakinuma، نويسنده , , Katsuyoshi، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2007
  • Pages
    6
  • From page
    1059
  • To page
    1064
  • Abstract
    Dielectric relaxations were investigated for the solid solution system Ce1−xNdxO2−δ (0.0 ≦ x ≦ 0.5) having a fluorite-type structure, which is a typical oxide-ion conductor. The dielectric constants showed anomalously large values at low frequencies and high temperatures. Numerical analysis of frequency dependence of dielectric constant (εr′) clarified that the anomalously large εr′ originated from the superimposition of both Debye-type polarization and interfacial polarization between electrolyte and electrode. Two kinds of Debye-type relaxations observed were ascribed to defect associates, (NdCe′ − VO¨)· and (NdCe′ − VO¨ − NdCe′)x. The Debye-type polarizations were also confirmed by analyzing the dielectric loss factor (εr″). When the oxide-ion conductivity decreased in the heavy Nd-doped samples, both the Debye-type and the interfacial polarizations also decreased, suggesting that ordering of oxygen vacancy suppressed the electric field response of Debye-type polarization, resulting in the decrease of oxide-ion conductivity.
  • Keywords
    Oxide-ion conductivity , dielectric constant , Defect associate , Debye-type polarization , oxygen vacancy
  • Journal title
    Solid State Ionics
  • Serial Year
    2007
  • Journal title
    Solid State Ionics
  • Record number

    1720064