Title of article :
Structural features in aligned poly(3-alkylthiophene) films revealed by grazing incidence X-ray diffraction
Author/Authors :
Bolognesi، نويسنده , , A. and Botta، نويسنده , , C. and Mercogliano، نويسنده , , C. and Porzio، نويسنده , , W. and Jukes، نويسنده , , P.C. and Geoghegan، نويسنده , , M. and Grell، نويسنده , , M. and Durell، نويسنده , , M. and Trolley، نويسنده , , D. and Das، نويسنده , , A. and Macdonald، نويسنده , , J.E.، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2004
Pages :
6
From page :
4133
To page :
4138
Abstract :
The structural ordering in as-spun and rubbed (then annealed) thin films of poly[(3-hexylmethoxy)thiophene] has been investigated by means of grazing incidence X-ray diffraction (GIXRD) and the results have been compared with the structural data as obtained from XRD on powder samples. In the structure of the as-spun films the thiophene rings in the backbone lie parallel to the plane of the interface with a well-defined separation among the chains of 19 إ. Rubbing the films creates a unique direction in which the domain size is increased, whereas ordering normal to the rubbing direction is greatly diminished, leading to dichroic behavior. Annealing the films at 95 °C seems to have no significant effect on the ordering thereafter.
Keywords :
Polymer alignment , Grazing incidence X-ray diffraction , Polythiophene
Journal title :
Polymer
Serial Year :
2004
Journal title :
Polymer
Record number :
1721800
Link To Document :
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