Title of article
Determination of electron inelastic mean free paths for poly[methyl(phenyl)silylene] films
Author/Authors
Zemek، نويسنده , , J. and Houdkova، نويسنده , , J. and Jiricek، نويسنده , , P. and Jablonski، نويسنده , , A. and Jurka، نويسنده , , V. and Kub، نويسنده , , J.، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2009
Pages
6
From page
2445
To page
2450
Abstract
The inelastic mean free paths (IMFPs) of electrons at a poly[methyl(phenyl)silylene] thin film surface were determined using elastic peak electron spectroscopy (EPES) and Monte Carlo calculations for a wide electron energy range, 200–1600 eV. We considered the surface composition determined from X-ray induced photoelectron spectra (XPS), the hydrogen concentration evaluated by EPES, and a correction for surface excitations. The results compare well to those calculated from the predictive TPP-2M and G1, formulae. Calculations carried out with the quantitative structure–property relationship of Cumpson and the formula of Ashley and Williams provide larger IMFP values, and can be useful only for a rough estimation.
Keywords
polymer physics , Polyp , inelastic mean free path
Journal title
Polymer
Serial Year
2009
Journal title
Polymer
Record number
1732901
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