Title of article :
UV, Raman and XRD study of polymorphism of poly(methyl-n-propylsilane)
Author/Authors :
Bukalov، نويسنده , , Sergey S. and Zubavichus، نويسنده , , Yan V. and Leites، نويسنده , , Larissa A. and Koe، نويسنده , , Julian R. and West، نويسنده , , Robert، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2009
Abstract :
Raman, UV and XRD studies have been performed to characterize the structures of differently prepared samples of poly(methyl-n-propylsilane). The results demonstrate polymorphism of this polymer between Tc and Tg. At room temperature the polymer can exist in up to four modifications which comprise one amorphous disordered phase and three more ordered modifications, differing in the interchain organization and in the silicon backbone conformations. The latter are considered to be deviant, transoid and all-anti, respectively. The number of the modifications present and relative amount of each strongly depends on the preparation method and thermal history of the sample as well as on the molecular weight.
Keywords :
UV , Raman , Polymorphism , Poly(methyl-n-propylsilane) , XRD methods