Title of article
Measuring daily Value-at-Risk of SSEC index: A new approach based on multifractal analysis and extreme value theory
Author/Authors
Wei، نويسنده , , Yu and Chen، نويسنده , , Wang and Lin، نويسنده , , Yu، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2013
Pages
12
From page
2163
To page
2174
Abstract
Recent studies in the econophysics literature reveal that price variability has fractal and multifractal characteristics not only in developed financial markets, but also in emerging markets. Taking high-frequency intraday quotes of the Shanghai Stock Exchange Component (SSEC) Index as example, this paper proposes a new method to measure daily Value-at-Risk (VaR) by combining the newly introduced multifractal volatility (MFV) model and the extreme value theory (EVT) method. Two VaR backtesting techniques are then employed to compare the performance of the model with that of a group of linear and nonlinear generalized autoregressive conditional heteroskedasticity (GARCH) models. The empirical results show the multifractal nature of price volatility in Chinese stock market. VaR measures based on the multifractal volatility model and EVT method outperform many GARCH-type models at high-risk levels.
Keywords
Extreme value theory , Value-at-Risk , Volatility measurement , multifractal analysis , Backtesting
Journal title
Physica A Statistical Mechanics and its Applications
Serial Year
2013
Journal title
Physica A Statistical Mechanics and its Applications
Record number
1736898
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