Title of article :
Measuring daily Value-at-Risk of SSEC index: A new approach based on multifractal analysis and extreme value theory
Author/Authors :
Wei، نويسنده , , Yu and Chen، نويسنده , , Wang and Lin، نويسنده , , Yu، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2013
Pages :
12
From page :
2163
To page :
2174
Abstract :
Recent studies in the econophysics literature reveal that price variability has fractal and multifractal characteristics not only in developed financial markets, but also in emerging markets. Taking high-frequency intraday quotes of the Shanghai Stock Exchange Component (SSEC) Index as example, this paper proposes a new method to measure daily Value-at-Risk (VaR) by combining the newly introduced multifractal volatility (MFV) model and the extreme value theory (EVT) method. Two VaR backtesting techniques are then employed to compare the performance of the model with that of a group of linear and nonlinear generalized autoregressive conditional heteroskedasticity (GARCH) models. The empirical results show the multifractal nature of price volatility in Chinese stock market. VaR measures based on the multifractal volatility model and EVT method outperform many GARCH-type models at high-risk levels.
Keywords :
Extreme value theory , Value-at-Risk , Volatility measurement , multifractal analysis , Backtesting
Journal title :
Physica A Statistical Mechanics and its Applications
Serial Year :
2013
Journal title :
Physica A Statistical Mechanics and its Applications
Record number :
1736898
Link To Document :
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