• Title of article

    Creep compliance mapping by atomic force microscopy

  • Author/Authors

    Braunsmann، نويسنده , , Christoph and Proksch، نويسنده , , Roger and Revenko، نويسنده , , Irène and Schنffer، نويسنده , , Tilman E.، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2014
  • Pages
    7
  • From page
    219
  • To page
    225
  • Abstract
    We present a method for mapping the spatial distribution of viscoelastic properties of heterogeneous samples using the atomic force microscope (AFM). By applying a force step load protocol to induce time dependent sample indentations we measured the local creep compliance of the sample. The creep compliance was quantified in terms of the standard linear solid model to give maps of the instant glassy modulus, the equilibrium rubbery modulus, and the retardation time. To reduce the influence of plastic deformations, the sample was preformed with an initial preload step. Different polymer samples with a homogeneous or a heterogeneous material composition on a microscopic scale were investigated.
  • Keywords
    Nanoindentation , Viscoelasticity , Double step loading
  • Journal title
    Polymer
  • Serial Year
    2014
  • Journal title
    Polymer
  • Record number

    1741556