Title of article :
Creep compliance mapping by atomic force microscopy
Author/Authors :
Braunsmann، نويسنده , , Christoph and Proksch، نويسنده , , Roger and Revenko، نويسنده , , Irène and Schنffer، نويسنده , , Tilman E.، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2014
Pages :
7
From page :
219
To page :
225
Abstract :
We present a method for mapping the spatial distribution of viscoelastic properties of heterogeneous samples using the atomic force microscope (AFM). By applying a force step load protocol to induce time dependent sample indentations we measured the local creep compliance of the sample. The creep compliance was quantified in terms of the standard linear solid model to give maps of the instant glassy modulus, the equilibrium rubbery modulus, and the retardation time. To reduce the influence of plastic deformations, the sample was preformed with an initial preload step. Different polymer samples with a homogeneous or a heterogeneous material composition on a microscopic scale were investigated.
Keywords :
Nanoindentation , Viscoelasticity , Double step loading
Journal title :
Polymer
Serial Year :
2014
Journal title :
Polymer
Record number :
1741556
Link To Document :
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