Title of article
Creep compliance mapping by atomic force microscopy
Author/Authors
Braunsmann، نويسنده , , Christoph and Proksch، نويسنده , , Roger and Revenko، نويسنده , , Irène and Schنffer، نويسنده , , Tilman E.، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2014
Pages
7
From page
219
To page
225
Abstract
We present a method for mapping the spatial distribution of viscoelastic properties of heterogeneous samples using the atomic force microscope (AFM). By applying a force step load protocol to induce time dependent sample indentations we measured the local creep compliance of the sample. The creep compliance was quantified in terms of the standard linear solid model to give maps of the instant glassy modulus, the equilibrium rubbery modulus, and the retardation time. To reduce the influence of plastic deformations, the sample was preformed with an initial preload step. Different polymer samples with a homogeneous or a heterogeneous material composition on a microscopic scale were investigated.
Keywords
Nanoindentation , Viscoelasticity , Double step loading
Journal title
Polymer
Serial Year
2014
Journal title
Polymer
Record number
1741556
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