Title of article
Positron trapping in plastically deformed Cd
Author/Authors
Sen Gupta، نويسنده , , A.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
4
From page
79
To page
82
Abstract
Positron measurements, both lifetime and annihilation lineshape, have been performed in Cd, plastically deformed at room temperature by 40 and 60% thickness reductions. Less change in lineshape parameter for 60% deformation is observed. The annealing of 40% deformed sample between 25 and 200 °C indicates the breaking up of dislocation network during recrystallisation process.
Keywords
Positron lifetime and annihilation lineshape , Plastic deformation of cadmium
Journal title
Solid State Communications
Serial Year
2002
Journal title
Solid State Communications
Record number
1762120
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