Title of article :
Intra- versus inter-site electronic excitations in NdNiO3 by resonant inelastic ultra-soft X-ray scattering at Ni 3p edge
Author/Authors :
Butorin، نويسنده , , S.M. and Sهthe، نويسنده , , C. and Agui، نويسنده , , A. and Saalem، نويسنده , , F. and Alonso، نويسنده , , J.A. and Nordgren، نويسنده , , J.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
5
From page :
716
To page :
720
Abstract :
Resonant ultra-soft X-ray scattering measurements performed on NiO, as a model system, and NdNiO3 reveal the presence of pronounced inelastic structures within a few eV below the elastic peak in both cases. A comparison of experimental data with the results of Anderson impurity model calculations indicates that for both oxides the inelastic part of recorded spectra mainly originates from the intra-atomic d–d excitations. Remarkably, no distinct signal from inter-site d–d transitions can be identified for both metallic and insulating NdNiO3 at small energy-losses. The lack of significant spectral contribution from the latter transitions in this compound indicates that states on the top (bottom) of the valence (conduction) band have predominantly O 2p character and the NdNiO3 insulator is rather of a p–p type.
Keywords :
E. Resonant inelastic X-ray scattering , A. NdNiO3
Journal title :
Solid State Communications
Serial Year :
2005
Journal title :
Solid State Communications
Record number :
1763283
Link To Document :
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