Author/Authors :
Lee، نويسنده , , H.S. and Yi، نويسنده , , S. and Kim، نويسنده , , T.W. and Park، نويسنده , , Y.J and Lee، نويسنده , , J.Y. and Kwon، نويسنده , , M.S. and Park، نويسنده , , H.L.، نويسنده ,
Abstract :
Selected area electron diffraction pattern (SADP) and transmission electron microscopy (TEM) measurements were carried out to investigate the spontaneously ordered structure in CdxZn1−xTe epilayers grown on GaAs (100) substrates. The SADP showed superstructure reflections with symmetrical intensity, and the high-resolution TEM (HRTEM) micrographs showed doublet periodicity in the contrast of the {100} lattice planes. The results of the SADP and the HRTEM measurements showed a Cu3Au-type ordered structure was formed in the CdxZn1−xTe epilayer. The present results can help improve understanding of the Cu3Au-type ordered structures in CdxZn1−xTe epilayers grown on GaAs substrates.
