Author/Authors :
Graf، نويسنده , , D. and Molitor، نويسنده , , F. and Ensslin، نويسنده , , K. and Stampfer، نويسنده , , C. and Jungen، نويسنده , , A. and Hierold، نويسنده , , C. and Wirtz، نويسنده , , L.، نويسنده ,
Abstract :
A Raman spectrum of a solid contains information about its vibrational and electronic properties. Collecting spectral data with spatial resolution and encoding it in a 2D plot generates images with information complementary to optical and scanning force imaging. In the case of few-layer graphene the frequency of the G line and especially the width of the D′ line turn out to be sensitive to single layers. The thickness of the few-layer graphene flake is reflected in the intensity of the G line and in the reduced intensity of the dominant peak of the underlying silicon oxide.
Keywords :
D. Electronic band structure , D. Optical properties , D. phonons , A. Thin films