Structural and UV photoluminescence properties of single crystalline SnO2 films grown on α - Al2O3 (0001) by MOCVD

High-quality single crystalline SnO2 films have been deposited on α-Al2O3 (0001) substrates by metalorganic chemical vapor deposition (MOCVD). The structural and photoluminescence (PL) properties of the SnO2 films were investigated. The prepared samples were epitaxial single crystalline films with the rutile structure of pure SnO2. A single and sharp ultraviolet (UV) PL peak near 331 nm was observed at room temperature (RT). At a temperature of 13 K, two other narrow PL peaks located at 369 and 375 nm as well as a broad feeble peak near 500 nm were observed. The corresponding PL mechanisms were investigated.