Title of article
Excitation energy evolution of photoluminescence spectrum in amorphous hydrogenated silicon
Author/Authors
Murayama، نويسنده , , Kazuro and Sano، نويسنده , , Wataru and Ito، نويسنده , , Taichi and Ogiwara، نويسنده , , Chisato، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
5
From page
315
To page
319
Abstract
Photoluminescence peak energy at 15 K in amorphous hydrogenated silicon (a-Si:H), prepared at substrate temperatures ( T s = ) 180–250 ∘C, increases with excitation energy in the excitation energy range lower than 1.52 eV in the Urbach tail region whilst for higher excitation energy range the peak energy is constant. The excitation energy at which the peak energy becomes constant is named the hopping-gap. The a-Si:H prepared at T s lower than 180 ∘C has higher hopping-gaps. Furthermore, it is shown that the rate of increase of the peak energy to the excitation energy agrees with that in photoluminescence of porous Si. The photoluminescence in a-Si:H is concluded to be due to the radiative recombination of electron–hole pairs quantum-confined in hydrogen-free Si nanostructures with a radius of 3–5 nm.
Keywords
D. Electronic states (localized) , E. Luminescence , A. Disordered system , A. Nanostructures
Journal title
Solid State Communications
Serial Year
2008
Journal title
Solid State Communications
Record number
1764244
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