• Title of article

    Nanolithography and manipulation of graphene using an atomic force microscope

  • Author/Authors

    Giesbers، نويسنده , , A.J.M. and Zeitler، نويسنده , , U. and Neubeck، نويسنده , , S. and Freitag، نويسنده , , F. and Novoselov، نويسنده , , K.S. and Maan، نويسنده , , J.C.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2008
  • Pages
    4
  • From page
    366
  • To page
    369
  • Abstract
    We use an atomic force microscope (AFM) to manipulate graphene films on a nanoscopic length scale. By means of local anodic oxidation with an AFM we are able to structure isolating trenches into single-layer and few-layer graphene flakes, opening the possibility of tabletop graphene based device fabrication. Trench sizes of less than 30 nm in width are attainable with this technique. Besides oxidation we also show the influence of mechanical peeling and scratching with an AFM of few layer graphene sheets placed on different substrates.
  • Keywords
    A. Graphene , E. Nanolithography , E. Atomic force microscopy
  • Journal title
    Solid State Communications
  • Serial Year
    2008
  • Journal title
    Solid State Communications
  • Record number

    1764405