Title of article
Nanolithography and manipulation of graphene using an atomic force microscope
Author/Authors
Giesbers، نويسنده , , A.J.M. and Zeitler، نويسنده , , U. and Neubeck، نويسنده , , S. and Freitag، نويسنده , , F. and Novoselov، نويسنده , , K.S. and Maan، نويسنده , , J.C.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
4
From page
366
To page
369
Abstract
We use an atomic force microscope (AFM) to manipulate graphene films on a nanoscopic length scale. By means of local anodic oxidation with an AFM we are able to structure isolating trenches into single-layer and few-layer graphene flakes, opening the possibility of tabletop graphene based device fabrication. Trench sizes of less than 30 nm in width are attainable with this technique. Besides oxidation we also show the influence of mechanical peeling and scratching with an AFM of few layer graphene sheets placed on different substrates.
Keywords
A. Graphene , E. Nanolithography , E. Atomic force microscopy
Journal title
Solid State Communications
Serial Year
2008
Journal title
Solid State Communications
Record number
1764405
Link To Document