Title of article
Monovacancy and substitutional defects in hexagonal silicon nanotubes
Author/Authors
Kim، نويسنده , , Gunn and Hong، نويسنده , , Suklyun، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2009
Pages
4
From page
408
To page
411
Abstract
We present a first-principles study of the geometrical and electronic structures of a hexagonal single-walled silicon nanotube with a monovacancy or a substitutional defect. The B, C, N, Al and P atoms are chosen as substitutional impurities. It is found that the defect such as a monovacancy or a substitutional impurity results in deformation of the hexagonal single-walled silicon nanotube. In both cases, a relatively localized unoccupied state near the Fermi level occurs due to this local deformation. The differences in geometrical and electronic properties of different substitutional impurities are discussed.
Keywords
A. Silicon nanotube , C. Monovacancy , D. Electronic structure , C. Substitutional defects
Journal title
Solid State Communications
Serial Year
2009
Journal title
Solid State Communications
Record number
1764971
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