Title of article :
Investigation of the crossover properties for the interaction parameters of a ferroelectric thin film
Author/Authors :
Lu، نويسنده , , Z.X. and Teng، نويسنده , , B.H. and Lu، نويسنده , , X.H. and Zhang، نويسنده , , X.J. and Wang، نويسنده , , C.D.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Pages :
4
From page :
1176
To page :
1179
Abstract :
The crossover feature, from the ferroelectric-dominant phase diagram (FPD) to the paraelectric-dominant phase diagram (PPD), for the interaction parameters of a ferroelectric thin film described by the transverse Ising model have been calculated in detail by the use of the mean-field approximation. The crossover values of the exchange interactions and the transverse fields for a thin film with certain layers are displayed as a curved surface in the three-dimensional parameter space. The numerical results show that for thin films with different numbers of layers there exists a common intersection line for the curved surfaces of the crossover values. Meanwhile the layer-independent equation for the intersection line is obtained for the first time.
Keywords :
A. Ferroelectrics , D. Phase diagram
Journal title :
Solid State Communications
Serial Year :
2009
Journal title :
Solid State Communications
Record number :
1765383
Link To Document :
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