Title of article :
Optical and electrical properties of bandgap engineered gallium-doped films
Author/Authors :
Wei، نويسنده , , Wei and Jin، نويسنده , , Chunming and Narayan، نويسنده , , Jagdish and Narayan، نويسنده , , Roger J.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Pages :
4
From page :
1670
To page :
1673
Abstract :
In this study, the optical and electrical properties of heavily gallium-doped MgxZn1−xO films were investigated. Films were epitaxially grown on c -plane sapphire substrates using pulsed laser deposition. Film transparency was shown to be greater than 90% in the visible spectrum. Absorption was shown to be extended to lower wavelengths in films with higher magnesium concentration values. Although transparency in the ultraviolet wavelength range was improved, conductivity was decreased. In MgxZn1−xO films with 0.5 at.% gallium, resistivity was increased from 1.9 × 1 0 − 3 Ω cm to 3.62 × 1 0 − 2 Ω cm as the magnesium concentration was increased from five atomic percent to fifteen atomic percent. These efforts will facilitate the development of zinc oxide-based ultraviolet–blue light emitting diodes, ultraviolet–blue light laser diodes, and other optoelectronic devices.
Keywords :
A. Type of materials thin films , D. Phenomena and properties optical properties , B. Preparation and processing laser processing
Journal title :
Solid State Communications
Serial Year :
2009
Journal title :
Solid State Communications
Record number :
1765930
Link To Document :
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