Title of article
Scanning tunneling microscope light emission spectra of polycrystalline and
Author/Authors
Uehara، نويسنده , , Y. and Kuwahara، نويسنده , , M. and Katano، نويسنده , , S. and Ushioda، نويسنده , , S.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2009
Pages
3
From page
1902
To page
1904
Abstract
We have observed scanning tunneling microscope light emission (STM-LE) spectra of Ge2Sb2Te5 and Sb2Te3. Although these chalcogenide alloys exhibit band gaps less than 0.5 eV, the STM-LE was observed with a narrow spectral width at a photon energy of 1.5 eV for both materials. By analyzing its bias voltage, polarity, and temperature dependencies combined with recently reported theoretical electronic structures, we concluded that the STM-LE is excited by electronic transitions taking place in the local electronic structure having a direct gap-like shape with a band gap of 1.5 eV, commonly found in the electronic structures of both materials.
Keywords
A. Semiconductors , C. Scanning tunneling microscopy , D. Electronic band structure
Journal title
Solid State Communications
Serial Year
2009
Journal title
Solid State Communications
Record number
1766055
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