Title of article
Modelling of strong coupling regime in bulk GaN microcavities using transfer matrix and quasiparticle formalisms
Author/Authors
Lionel Revéret، نويسنده , , F. and Disseix، نويسنده , , P. and Leymarie، نويسنده , , J. and Vasson، نويسنده , , A. and Semond، نويسنده , , F. and Leroux، نويسنده , , M. and Massies، نويسنده , , J.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2010
Pages
5
From page
122
To page
126
Abstract
The evolution of the polaritonic Rabi splitting versus the excitonic broadenings is analyzed within two different formalisms: the transfer-matrix and the quasiparticle models. The splittings are deduced from angle-resolved reflectivity measurements performed at 5 K and 300 K on two GaN microcavities grown on silicon. Although the quasiparticle model allows a qualitative analysis when the quality factor of the cavity is high, the transfer-matrix formalism is more appropriate for the interpretation of the reflectivity spectra, whatever the configuration of the structure.
Keywords
A. Semiconductors , C. Microcavities , D. Strong coupling , E. Optical spectroscopy
Journal title
Solid State Communications
Serial Year
2010
Journal title
Solid State Communications
Record number
1766310
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