Title of article :
Measurement of the diffusion length of minority carriers using a steady-state photocarrier grating
Author/Authors :
Yadav، نويسنده , , Dheerendra and Agarwal، نويسنده , , S.C.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2010
Pages :
4
From page :
321
To page :
324
Abstract :
An improper orientation of the sample electrodes with respect to the interference fringes in the steady-state photocarrier grating (SSPG) setup can lead to large errors in the measured diffusion length ( L ). A simple analysis shows that the measured L is always larger than the actual L if the sample is misaligned. The analysis compares well with the experimental data taken on a hydrogenated amorphous silicon sample.
Keywords :
A. Amorphous silicon , B. Steady-state photocarrier grating , D. Photoconductivity , C. Diffusion length
Journal title :
Solid State Communications
Serial Year :
2010
Journal title :
Solid State Communications
Record number :
1766421
Link To Document :
بازگشت