Title of article :
Two-sided empirical Bayes test for truncation parameter using NA samples
Author/Authors :
Yimin Shi، نويسنده , , Xiaolin Shi، نويسنده , , Jie Yan، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
10
From page :
65
To page :
74
Keywords :
The truncated distribution family , Asymptotic optimality , Empirical Bayes test , Negatively associated samples , convergence rate
Journal title :
Information Sciences
Serial Year :
2005
Journal title :
Information Sciences
Record number :
176832
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=176832
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