• Title of article

    In-donor complexes in Si and Ge: structure and electric field gradients

  • Author/Authors

    A. Settels، نويسنده , , A. and Schroeder، نويسنده , , K. and Korhonen، نويسنده , , T. and Papanikolaou، نويسنده , , N. and Aretz، نويسنده , , M. and Zeller، نويسنده , , R. and Dederichs، نويسنده , , P.H.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    5
  • From page
    239
  • To page
    243
  • Abstract
    The electronic and geometrical structure of neutral InD (D=P, As, Sb) acceptor–donor pairs in silicon and germanium is studied using two complementary ab-initio methods, i.e. the all-electron Korringa–Kohn–Rostoker (KKR) Greenʹs function method and the pseudopotential ab-initio molecular dynamics method. Furthermore the electric field gradients are predicted at the In sites, which can be measured by PAC experiments using the 117Cd/117In probe. The results for the InD pairs are compared with the geometrical structures and in particular with the electric field gradients of the isoelectronic [CdD]− complexes in silicon and germanium. The lattice relaxations calculated by both theoretical methods for the InD complexes agree quite well and are similar to the relaxations for the [CdD]− complexes, which have been studied extensively in PAC experiments using the 111In/111Cd probe. In contrast to this the calculated In electric field gradients are, however, considerably larger than the Cd ones.
  • Keywords
    A. Semiconductors , C. Impurities in semiconductors , E. Nuclear resonances , C. Point defects
  • Journal title
    Solid State Communications
  • Serial Year
    1999
  • Journal title
    Solid State Communications
  • Record number

    1768876