• Title of article

    Quasiresonant inelastic X-ray scattering: comparison of Compton and resonant terms

  • Author/Authors

    Machavariani، نويسنده , , G.Yu. and Machavariani، نويسنده , , V.Sh. and Vedrinskii، نويسنده , , R.V.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    3
  • From page
    81
  • To page
    83
  • Abstract
    The contributions to inelastic X-ray scattering (IXS) spectra from the Compton scattering and X-ray resonant Raman scattering processes are theoretically compared. It is found that in the case of the atoms from Ni to Ge the main contribution to the IXS cross section originates from the process associated with the formation of the intermediate virtual state (with 1s vacancy) even when the incident photon energy is (several keV) less then the K absorption edge. The double differential cross section is expressed in terms of s, p and d partial local densities of electron states.
  • Keywords
    A. Disordered systems , C. X-ray scattering , D. Electronic band structure
  • Journal title
    Solid State Communications
  • Serial Year
    2000
  • Journal title
    Solid State Communications
  • Record number

    1769454