Title of article :
Optical characterization of CdTe/ZnSe fractional monolayer structures grown by atomic layer epitaxy
Author/Authors :
Lee، نويسنده , , Jing-Jy and Chang، نويسنده , , J.H. and Yang، نويسنده , , M. and Ahn، نويسنده , , H.S. and Yi، نويسنده , , S.N. and Goto، نويسنده , , K. and Godo، نويسنده , , K. and Makino، نويسنده , , H. and Cho، نويسنده , , M.W. and Yao، نويسنده , , T. and Song، نويسنده , , J.S.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2004
Pages :
4
From page :
611
To page :
614
Abstract :
Luminescence properties of CdTe/ZnSe fractional monolayer grown by atomic layer epitaxy have been investigated. To investigate the origin of the highly efficient luminescence, various optical spectroscopic methods such as, photoluminescence (PL), temporal/spatial resolved PL, temperature dependence PL, and excitation power dependence PL have been used. It is found that structural inhomogeneities affect dominant influence on the line width and line shape of luminescence. The luminescence intensity greatly enhanced by the localization of exciton at the disorder induced localized states.
Keywords :
II–VI compounds , Exciton localization
Journal title :
Current Applied Physics
Serial Year :
2004
Journal title :
Current Applied Physics
Record number :
1769624
Link To Document :
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