Title of article :
Relation between interdiffusion and polarity for MBE growth of GaN epilayers on ZnO substrates
Author/Authors :
Suzuki، نويسنده , , Takuma and Harada، نويسنده , , Chihiro and Goto، نويسنده , , Hiroki and Minegishi، نويسنده , , Tsutomu and Setiawan، نويسنده , , Agus and Ko، نويسنده , , H.J. and Cho، نويسنده , , Meoung-Whan and Yao، نويسنده , , T.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2004
Pages :
4
From page :
643
To page :
646
Abstract :
We report on GaN growth on Zn-polar ZnO substrates using plasma-assisted molecular-beam epitaxy (P-MBE). Before GaN growth, ZnO substrate annealing conditions were optimized. Reflection high-energy electron diffraction (RHEED) patterns after low-temperature GaN buffer layer annealing changed from streaky to spotty, suggesting that zinc and oxygen atoms interdiffuse from the ZnO substrate into the GaN epilayer. This interdiffusion results in a mix-polar GaN epilayer.
Keywords :
ZNO , Molecular Beam Epitaxy , Hetero interface , Polarity , GaN
Journal title :
Current Applied Physics
Serial Year :
2004
Journal title :
Current Applied Physics
Record number :
1769654
Link To Document :
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