Title of article :
Simultaneous measurement on particles in solution with size ranging from nm to sub-mm by microscope light scattering spectroscopy and image analyzing system
Author/Authors :
Huang، نويسنده , , Yao-Xiong، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2005
Pages :
4
From page :
549
To page :
552
Abstract :
A novel microscope light scattering spectroscopy and image analyzing system has been developed for simultaneous measurements on particle size distribution in solutions with size ranging from nanometer to sub-millimeter, and for surface porosity analysis on solid materials. The present paper introduces the technique of this system and its applications to various materials.
Keywords :
Microscope light scattering spectroscopy , Nano-particle , Size distribution , surface porosity
Journal title :
Current Applied Physics
Serial Year :
2005
Journal title :
Current Applied Physics
Record number :
1769967
Link To Document :
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