Title of article
Structure and properties of thermally annealed fullerene films
Author/Authors
Akselrod، نويسنده , , L. and Byme، نويسنده , , H.J. and Sutto، نويسنده , , T.E. and Roth، نويسنده , , S.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1995
Pages
8
From page
436
To page
443
Abstract
The effects of postdeposition thermal annealing on the structure and properties of C60 films are investigated. Non-oxygenated C60 films are heated at 200°C under vacuum. UV/visible absorption spectroscopy shows a decrease in the intensities of the allowed transitions and a red-shift of up to 50 run. IR analyses show no indication of chemical alteration of the sample. X-ray studies reveal cubic symmetry in the unannealed thin films, while the annealed films show a mixture of face-centred cubic and hexagonal close-packed phases and a higher degree of crystallinity. Room-temperature Raman studies in the region of the pentagonal pinch mode reveal the presence of two components. The first component, at 1468 cm−1, is photochemically unstable, as is the pristine material. The second component, positioned at 1464 cm−1, remains stable under prolonged low-intensity illumination. The effects of thermal annealing of oxygen-free films are contrasted to those of thermal treatment under oxygen and it is concluded that the modifications are structural in nature.
Journal title
Chemical Physics Letters
Serial Year
1995
Journal title
Chemical Physics Letters
Record number
1770869
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